Semiconductor Test Pin – High-Performance Spring-Loaded Contact Probe for Precision Testing
Premium chrome-plated brass core ensures superior conductivity and corrosion resistance for long-term reliability. Hardened steel plunger with gold-plated tips minimizes contact resistance, enhancing signal stability in high-frequency testing. Multi-stage spring mechanism delivers consistent 50-150g contact force, preventing damage to delicate SMT/SMD components. Ultra-fine 0.3-1.5mm pitch compatibility suits microchip probing in wafer-level and PCB testing. Industrial-grade tungsten carbide barrel withstands 500,000+ actuations, ideal for automated test equipment (ATE) and automotive ECU validation. Beveled tip design prevents solder snagging during in-circuit testing (ICT). Applications: Semiconductor wafer probing, BGA/QFN validation, battery management system (BMS) testing, and EV charging port continuity checks. OEM-friendly bulk packaging (1000pcs/tube) for production line efficiency. Exclusive wholesale pricing for volume buyers – factory-direct quality without distributor markups. ISO 9001-certified manufacturing with full RoHS/REACH compliance.